Listings in Thin-Film, Semiconductor Analysis Services, Laser-Beam Profilers and Magnetic Sensors / Devices

tectra GmbH

in Ion Guns, Thin-Film, Evaporators, Sputtering Systems, Sputtering Guns, RF / Microwave Components, Evaporation Systems, Evaporation Sources, Photon Detection / Counting Systems

Components and Systems made by tectra are well established and valued in the scientific community of physicists and material researchers around the world.

Reuterweg 51 - 52
Frankfurt
D-60323
Germany

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Angstrom Sciences, Inc.

in Thin-Film, Sputtering Systems, Sputtering Guns, RF Power Supplies, Alloys - Specialty, Targets, Sputtering Targets, Sputtering Services, Metal

Angstrom Sciences supplies high performance magnetron sputter sources and PVD materials for a wide variety of thin film applications

40 S. Linden Street
Duquesne, Pennsylvania 15110
United States of America

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Angstrom Engineering Inc.

in Plasma, Semiconductor Equipment, Chemical Vapor Deposition Systems, Ion Guns, Thin-Film, General, Electron Beam Sources / Systems, Alloys - High-Temperature, Chambers, Electron-Beam

We create thin film deposition systems for research and production. Our evaporators & sputtering systems are used worldwide by partners who trust us.

91 Trillium Dr.
Kitchener, Ontario N2E 1W8
Canada

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Metrolab Technology SA

in Superconducting Magnets, Magnetometers - Hall Effect, Magnets, Gaussmeters, Magnetometers, Hall Effect Probes, Magnetic Shielding, Magnetic Sensors / Devices, Field Probes

Metrolab is the global market leader for precision magnetometers, used to measure strong magnetic fields with great precision.

110, chemin du Pont-du-Centenaire
CH-1228
Switzerland

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Anderson Materials Evaluation, Inc.

in Materials Characterization, Electron Microscopy, Analytical Services, Semiconductor Analysis Services, Microscopy Services, Materials Analysis, Testing / Analysis Services, Sputtering Services, Chemical Analysis, Coating Thickness Measurement

We are your path to replacing speculation with understanding, whether your problem is due to contamination, corrosion, process control, vendor error, unknown properties of new materials, a new property requirement, or the usual unruly suspects.

9051 Red Branch Road
Suite C
Columbia, Maryland 21045
United States of America

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BARTH ELECTRONICS, INC.

in Semiconductor Analysis Services

1589 Foothill Dr
Boulder City, Nevada 89005
United States of America

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Aystorm Scientific Ltd

in Semiconductor Analysis Services

Richmond House Mersey Road Sale

United Kingdom

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EP Laboratories Inc.

in Semiconductor Analysis Services

196 Technology Dr.
Irvine, California
United States of America

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Jolly Green Lasers

in Laser-Beam Profilers

14 Temple Way

United Kingdom

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