Search
NEi Software
in Computer-Aided Design / Engineering, Simulations, Statistical / Analysis
5555 Garden Grove Blvd.
Ste. 300
Westminster, California
92683-1886
United States of America
Photon etc.
in Cameras - Infrared / Thermal, Materials Characterization, Optical System Design Services, Microscopes - General, Instrument Design / Development, Raman Spectrometers, Materials Analysis, Microscopes - Confocal, Vision Systems, Infrared Measuring Equipment
Offering optical analysis solutions based on strong know-how in infrared and hyperspectral imaging instrumentation. Its essential products are widely tunable laser filters, science grade infrared cameras and global hyperspectral imaging systems.
5795 De Gaspe Avenue
Montreal, Quebec
H2S 2X3
Canada
514-385-9555
Fax: 514-279-5493
Plasma Technology Systems
in Plasma, Plasma Cleaning Systems, Plasma Systems, Anti-Contamination, Electron-Beam
276 Harbor Blvd
Belmont, California
94002
United States of America
650-596-1606
Fax: 650-596-1180
Metrolab Technology SA
in Superconducting Magnets, Magnetometers - Hall Effect, Magnets, Gaussmeters, Magnetometers, Hall Effect Probes, Magnetic Shielding, Magnetic Sensors / Devices, Field Probes
Metrolab is the global market leader for precision magnetometers, used to measure strong magnetic fields with great precision.
110, chemin du Pont-du-Centenaire
CH-1228
Switzerland
Anderson Materials Evaluation, Inc.
in Materials Characterization, Electron Microscopy, Analytical Services, Semiconductor Analysis Services, Microscopy Services, Materials Analysis, Testing / Analysis Services, Sputtering Services, Chemical Analysis, Coating Thickness Measurement
We are your path to replacing speculation with understanding, whether your problem is due to contamination, corrosion, process control, vendor error, unknown properties of new materials, a new property requirement, or the usual unruly suspects.
9051 Red Branch Road
Suite C
Columbia, Maryland
21045
United States of America
410-740-8562
Fax: 410-740-8201
Geller MicroAnalytical Laboratory Inc.
in Materials Characterization, Electron Microscopy, Analytical Services, Semiconductor Analysis Services, Electron Microscopes, Microscopy Services, Materials Analysis, Testing / Analysis Services, Calibration, Coating Thickness Measurement
426e Boston St.
TOPSFIELD, Massachusetts
01983-1216
United States of America
978-887-7000
Fax: 978 887-6671
Synopsys
in Optical System Design Services, Computer-Aided Design / Engineering, Optical Design, Custom Optical Components, Optical Design
199 S. Los Robles Avenue
Suite 400
Pasadena, California
91101
United States of America
626-795-9101
Fax: 626-795-9102
Park Systems, Inc.
in Materials Characterization, Semiconductor Equipment, Microscopes - General, Lithography Systems, Magnetic Force Microscopes, Microscopes -Scanning Probe, Microscopes - Scanning Tunneling, Microscopes - Atomic Force Microscopes
3040 Olcott St
Santa Clara, California
95054
United States of America
408-986-1110
Fax: 823-154-66805
Angstrom Engineering Inc.
in Plasma, Semiconductor Equipment, Chemical Vapor Deposition Systems, Ion Guns, Thin-Film, General, Electron Beam Sources / Systems, Alloys - High-Temperature, Chambers, Electron-Beam
We create thin film deposition systems for research and production. Our evaporators & sputtering systems are used worldwide by partners who trust us.
91 Trillium Dr.
Kitchener, Ontario
N2E 1W8
Canada