Listings in Electronic Test and Measurement, Classroom Demonstration Apparatus, X-ray Cameras, Beam Profile Monitors and Coating Thickness Measurement

Teledyne Princeton Instruments

in Spectrographs, Materials Characterization, Image Intensifiers, Spectrometers - Visible, Cameras - CCD, Cameras - Digital, Raman Spectrometers, Cameras - Low-Light Level, X-ray Cameras, Cameras - UV, X-ray Detectors, Spectrometers - Ultraviolet

Teledyne Princeton Instruments designs and manufactures high-performance CCD, ICCD, EMCCD, InGaAs, and back-illuminated sCMOS cameras; high-throughput spectrographs; complete spectroscopy systems and optics-based solutions for research and industry.

3660 Quakerbridge Road
Trenton, New Jersey 08619
United States of America

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JANIS RESEARCH COMPANY, LLC

in Optical Cryostats, Cryostats - All-Purpose, Cryostats - Closed-Cycle, Cryocoolers, Superconducting Magnets, Transfer Lines, Systems, Electronic Test and Measurement, Dilution Refrigerators, Cryostats - Variable Temperature, He3 Refrigerators

Janis Research offers cryogenic research equipment – standard and custom designs to suit your low and ultra-low temperature experiment requirements. Dedicated to the design, fabrication and delivery of the best systems and components in the industry

225 Wildwood Avenue
Woburn, Massachusetts 01801-2025
United States of America

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781-491-0888
Fax: 1-781-491-0889

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Anderson Materials Evaluation, Inc.

in Materials Characterization, Electron Microscopy, Analytical Services, Semiconductor Analysis Services, Microscopy Services, Materials Analysis, Testing / Analysis Services, Sputtering Services, Chemical Analysis, Coating Thickness Measurement

We are your path to replacing speculation with understanding, whether your problem is due to contamination, corrosion, process control, vendor error, unknown properties of new materials, a new property requirement, or the usual unruly suspects.

9051 Red Branch Road
Suite C
Columbia, Maryland 21045
United States of America

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Agilent Technologies-Vacuum Products Division

in Electronic Test and Measurement

121 Hartwell Avenue
Lexington, Massachusetts 2421
United States of America

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National Electrostatics Corp.

in Beam Profile Monitors

7540 Graber Rd.
Box 620310
Middleton, Wisconsin 53562
United States of America

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608-831-7600
Fax: 608-831-9591

Instrumentation Technologies

in Beam Profile Monitors

Velika pot 22

Slovenia

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Ciencia, Inc.

in Classroom Demonstration Apparatus

111 Roberts St.
East Hartford, Connecticut 6108
United States of America

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